发明名称 半導体装置の製造方法及びCMP組成物の使用方法
摘要 Provided is a process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of borophosphosilicate glass (BPSG) material in the presence of a chemical mechanical polishing (CMP) composition which comprises: (A) inorganic particles, organic particles, or a mixture or composite thereof, (B) at least one type of anionic phosphate or phosphonate as dispersing agent or charge reversal agent, (C) at least one type of surfactant, and (D) an aqueous medium.
申请公布号 JP6035346(B2) 申请公布日期 2016.11.30
申请号 JP20140548215 申请日期 2011.12.21
申请人 ビーエーエスエフ ソシエタス・ヨーロピアBASF SE 发明人 ヴェンカタラマン,シャム スンダール;スー,エアソン ユー−シェン
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
代理机构 代理人
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