发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which uses an oxide semiconductor layer and has less variation in electric characteristics; and provide a fine semiconductor device capable of high-speed drive and a high-speed operation, which is highly reliable and exhibits stable electric characteristics; and manufacture the semiconductor device.SOLUTION: A semiconductor device comprises: a multilayer film including an oxide semiconductor layer and an oxide layer which enwraps the oxide semiconductor layer: a laminate of a gate insulation film on the multilayer film and a gate electrode; a source electrode and a drain electrode; and a protective insulation film on the multilayer film, the gate insulation film, the gate electrode, the source electrode and the drain electrode. The multilayer film has a cross section with ends each having curvature.
申请公布号 JP6033045(B2) 申请公布日期 2016.11.30
申请号 JP20120244908 申请日期 2012.11.06
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平;須澤 英臣
分类号 H01L29/786;C23C14/08;H01L21/3065;H01L21/336;H01L21/363;H01L21/8242;H01L27/10;H01L27/105;H01L27/108 主分类号 H01L29/786
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