发明名称 集塵用治具、基板処理装置及びパーティクル捕集方法。
摘要 This dust collection tool (1) collects particles contained inside a machine that is used in a semiconductor production process and is to have a substrate for semiconductor production placed therein. The dust collection tool (1) is provided with: a base plate (10) that is transportable by a substrate transport mechanism, provided inside the machine, for transporting a substrate (W) to be processed; a filter unit (4) that is provided on the base plate and collects particles contained in the airflow; and a flow passage for letting the airflow pass through into the filter unit.
申请公布号 JP6036742(B2) 申请公布日期 2016.11.30
申请号 JP20140083062 申请日期 2014.04.14
申请人 東京エレクトロン株式会社 发明人 羽島 仁志
分类号 H01L21/677;B01D41/04;B01D46/12;B01D46/42;B03C3/011;B03C3/019;B03C3/155;B03C3/28 主分类号 H01L21/677
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