发明名称 Monitoring devices and processes based on transformation, destruction and conversion of nanostructures
摘要 A large number of properties of nanostructures depend on their size, shape and many other parameters. As the size of a nanostructure decreases, there is a rapid change in many properties. When the nanostructure is completely destroyed, those properties essentially disappear. Systems based on changes in properties of nanostructures due to the destruction of nanostructures are proposed. The systems can be used for monitoring the total exposure to organic, inorganic, organometallic and biological compounds and agents using analytical methods.
申请公布号 IL218536(A) 申请公布日期 2016.11.30
申请号 IL20120218536 申请日期 2012.03.07
申请人 JP LABORATORIES INC. 发明人
分类号 B82B 主分类号 B82B
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