METHOD AND APPARATUS FOR CLASSIFYING A SIGNAL WAVEFORM UNDER TEST

摘要

There is provided a method of classifying a signal waveform under test for appropriate numerical measurement, comprising acquiring waveform data indicative of the signal waveform under test, analysing the waveform data, determining a signal waveform type from the analysed waveform data, and activating an appropriate numerical measurement of the signal waveform under test based upon the determined signal waveform type. There is also provided a test and measurement instrument configured to carry out any of the disclosed methods.