METHOD FOR DETERMINING PAYLOAD PARAMETERS OF A DEVICE UNDER TEST

摘要

The invention refers to a method for determining of a payload parameter of a device under test (110) wherein the payload parameter to be determined is dependent from a frequency band or is dependent from a noise temperature, comprising the steps of conducting a plurality of near field payload measurements of the device under test (110). Further, a respective near-field correction factor (v) is determined for each measurement of the payload parameter. Finally, the payload parameter is determined for the frequency band or the noise temperature by calculation from the respective measured plurality of payload parameters and the respective near-field correction factors (v).