发明名称 記憶装置
摘要 The semiconductor memory device includes: a memory circuit including a transistor including an oxide semiconductor in a semiconductor layer; a capacitor for storing electric charge for reading data retained in the memory circuit; a charge storage circuit for controlling storage of electric charge in the capacitor; a data detection circuit for controlling data reading; a timing control circuit for generating a first signal controlling storage of electric charge in the capacitor (storage is conducted with the charge storage circuit, and the first signal is generated with a second signal at a supply voltage and a third signal delayed from the second signal at the supply voltage in a period immediately after the supply of the supply voltage); an inverter circuit for outputting a potential obtained by inverting a potential of one electrode of the capacitor.
申请公布号 JP6028117(B2) 申请公布日期 2016.11.16
申请号 JP20160021052 申请日期 2016.02.05
申请人 株式会社半導体エネルギー研究所 发明人 遠藤 正己
分类号 H03K19/0175;H01L21/28;H01L21/336;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/417;H01L29/423;H01L29/49;H01L29/786;H01L29/788;H01L29/792;H03K19/096 主分类号 H03K19/0175
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