发明名称 半導体装置の製造方法
摘要 A method for producing a semiconductor device includes: an arranging process of arranging a plurality of silicon carbide wafers having opposed first and surfaces so that the first surface and the second surface of adjacent silicon carbide wafers face each other and are separated in parallel; and a heat treatment process of heating the arranged plurality of silicon carbide wafers so that the first surface of each silicon carbide wafer becomes higher in temperature than the second surface thereof, and, in the adjacent silicon carbide wafers, the second surface of one silicon carbide wafer becomes higher in temperature than the first surface of the other silicon carbide wafer that faces the second surface.
申请公布号 JP6026873(B2) 申请公布日期 2016.11.16
申请号 JP20120263471 申请日期 2012.11.30
申请人 トヨタ自動車株式会社;株式会社デンソー 发明人 辻村 理俊;藤原 広和;森野 友生;副島 成雅
分类号 H01L21/324;H01L21/265 主分类号 H01L21/324
代理机构 代理人
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