发明名称 |
Semiconductor sensor and method of manufacturing the same |
摘要 |
This invention provides a semiconductor sensor (21) whose diaphragm (25) is resistant to breakage and in which variations in sensor sensitivity are small. A recess (26) is formed in a bottom surface of an SOI substrate obtained by bonding a Si substrate (22) and a Si thin film (24) with a SiO 2 film (23) interposed therebetween. Part of the Si thin film (24) constitutes the diaphragm (25) functioning as a sensitive region. In a top outer circumference of the recess (26), the SiO 2 film (23) covers a bottom outer circumference of the diaphragm (25) such that a bottom surface of the diaphragm (25) is exposed in its region except the outer circumference at a top surface of the recess (26). The SiO 2 film (23) (reinforcement (23a) covering the bottom outer circumference of the diaphragm (25) tapers off at its bottom surface such that the film thickness gradually decreases from a side of the outer circumference of the diaphragm (25) toward the center of the diaphragm (25). |
申请公布号 |
EP2226620(B1) |
申请公布日期 |
2016.11.16 |
申请号 |
EP20100153783 |
申请日期 |
2010.02.17 |
申请人 |
OMRON CORPORATION |
发明人 |
ADACHI, YOSHITAKA;INOUE, KATSUYUKI |
分类号 |
G01L9/06;B81B3/00;G01L9/00 |
主分类号 |
G01L9/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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