发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which stable electric characteristics are given to a transistor using an oxide semiconductor film; and provide a semiconductor integrated circuit functioning as an element for composing a transistor which has achieved microfabrication.SOLUTION: A semiconductor device comprises: a first transistor including first wiring, second wiring, third wiring, fourth wiring, a first gate electrode, a first source electrode and a first drain electrode; and a second transistor including a second gate electrode, a second source electrode and a second drain electrode. The first transistor is provided on a substrate containing a semiconductor material. The second transistor is composed of a multilayer film including an oxide semiconductor film. The second source electrode and the second drain electrode are formed by etching by using a resist mask formed by electron beam exposure.
申请公布号 JP6026844(B2) 申请公布日期 2016.11.16
申请号 JP20120229749 申请日期 2012.10.17
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平;永井 雅晴;花岡 一哉
分类号 H01L21/8242;G11C11/405;H01L27/108 主分类号 H01L21/8242
代理机构 代理人
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