| 摘要 |
PROBLEM TO BE SOLVED: To provide a method which allows for accurate cross-section observation, by preventing decomposition of a sample which is decomposed easily when exposed to the atmosphere.SOLUTION: A sample table 10 for electron microscope used for cross-section observation of a sample subjected to cross-section processing includes a sample table body 11 having a recess 13 of predetermined depth in an upper surface 11a of the body trunk, and at least one through hole 14 formed in a trunk side face 11b to penetrate from the side face 11b to the recess 13, and a fixing member 12 being inserted into the through hole 14. In the sample table 10 for electron microscope, a sample table for cross-section processing that is mounting a sample subjected to cross-section processing is mounted in the recess 13 of the sample table body 11, and attached while being fixed by the fixing member 12 penetrated the through hole 14. |
