发明名称 |
PHOTONIC DEGRADATION MONITORING FOR SEMICONDUCTOR DEVICES |
摘要 |
Methods of testing a semiconductor, and semiconductor testing apparatus, are described. In an example, a method for testing a semiconductor can include applying light on the semiconductor to induce photonic degradation. The method can also include receiving a photoluminescence measurement induced from the applied light from the semiconductor and monitoring the photonic degradation of the semiconductor from the photoluminescence measurement. |
申请公布号 |
WO2016179118(A1) |
申请公布日期 |
2016.11.10 |
申请号 |
WO2016US30476 |
申请日期 |
2016.05.02 |
申请人 |
SUNPOWER CORPORATION |
发明人 |
TU, Xiuwen;SOLTZ, David Aitan;JOHNSON, Michael C.;RIM, Seung Bum;QIU, Taiqing;SHEN, Yu-Chen;TRACY, Kieran Mark |
分类号 |
G01N3/56;G01N21/88 |
主分类号 |
G01N3/56 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|