发明名称 連続板厚測定装置、クラウン検査装置及びその検査方法、リップル検査装置及びその検査方法、ならびにクラウン制御装置及びその制御方法
摘要 PROBLEM TO BE SOLVED: To provide a non-contact type continuous board thickness measuring instrument capable of continuously and accurately measuring a board thickness distribution in one direction even regardless of an easily deformable thin board, such as an aluminum alloy plate.SOLUTION: A continuous board thickness measuring instrument includes a capacitance type thickness gauge provided with a pair of sensors 11, 12 installed separately and oppositely on a plate surface of a work-piece W, feed rollers 4, 5 provided in front of and behind the sensors 11, 12 to feed the work-piece W in one direction, a placing table 6 having a reference surface having a flat top surface to have the work-piece W to be placed thereon, and a guide plate 7 for pressing the work-piece W on the placing table 6 on both sides of the sensors 11, 12 so as to prevent the work-piece W floating over. The respective feed rollers 4, 5 have metal lower rollers 42, 52 installed with a contact part with the work-piece W on a circumferential surface met with the reference surface, and upper rollers 41, 51 provided with an elastic member on a circumferential surface to sandwich the work-piece W in cooperation with the lower rollers 42, 52 freely contactably and separably with/from the work-piece W.
申请公布号 JP6022160(B2) 申请公布日期 2016.11.09
申请号 JP20120006410 申请日期 2012.01.16
申请人 株式会社神戸製鋼所;株式会社エスピーテック 发明人 阿久津 公一;鶴見 敏彦;野口 茂
分类号 G01B7/06;B21B37/00;B21B37/28;B21C51/00 主分类号 G01B7/06
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