| 摘要 |
PROBLEM TO BE SOLVED: To improve a detection accuracy of an eddy current flaw by using information other than an image acquired by an image flaw detector.SOLUTION: A surface defect inspection device 1 of the present invention is a surface defect inspection device 1 for inspecting a surface defect generated on the surface of a base material W for a base material W hot-rolled during the passing, and includes: an eddy current flaw part 2 for continuously detecting electromagnetic characteristics of the base material W during the passing and detecting the surface defect from a discontinuous change of the detected electromagnetic characteristics; an image flaw part 3 disposed so as to be adjacent to the eddy current flaw part 2 along the passing direction of the base material W, imaging the surface of the base material during the passing, and detecting the surface defect from the imaged image; and a defect determination part 4 for performing a defect determination, while removing an erroneously detected signal by performing a correction based on the information acquired by an image flaw part 3. |
