发明名称 半導体装置
摘要 An object is to provide a semiconductor device including an oxide semiconductor, which maintains favorable characteristics and achieves miniaturization. The semiconductor device includes an oxide semiconductor layer, a source electrode and a drain electrode in contact with the oxide semiconductor layer, a gate electrode overlapping with the oxide semiconductor layer, and a gate insulating layer provided between the oxide semiconductor layer and the gate electrode, in which the source electrode and the drain electrode each include a first conductive layer, and a second conductive layer having a region which extends in a channel length direction from an end portion of the first conductive layer.
申请公布号 JP6023245(B2) 申请公布日期 2016.11.09
申请号 JP20150048646 申请日期 2015.03.11
申请人 株式会社半導体エネルギー研究所 发明人 山崎 舜平;郷戸 宏充;須澤 英臣;笹川 慎也;倉田 求;三上 真弓
分类号 H01L29/786;H01L21/28;H01L21/336;H01L21/8242;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/417;H01L29/423;H01L29/49;H01L29/788;H01L29/792 主分类号 H01L29/786
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