发明名称 MEMSキャビティ底からのシリコン残留物の消去
摘要 The present invention generally relates to a MEMS device in which silicon residues from the adhesion promoter material are reduced or even eliminated from the cavity floor. The adhesion promoter is typically used to adhere sacrificial material to material above the substrate. The adhesion promoter is the removed along with then sacrificial material. However, the adhesion promoter leaves silicon based residues within the cavity upon removal. The inventors have discovered that the adhesion promoter can be removed from the cavity area prior to depositing the sacrificial material. The adhesion promoter which remains over the remainder of the substrate is sufficient to adhere the sacrificial material to the substrate without fear of the sacrificial material delaminating. Because no adhesion promoter is used in the cavity area of the device, no silicon residues will be present within the cavity after the switching element of the MEMS device is freed.
申请公布号 JP6021914(B2) 申请公布日期 2016.11.09
申请号 JP20140524104 申请日期 2012.08.03
申请人 キャベンディッシュ・キネティックス・インコーポレイテッドCAVENDISH KINETICS, INC. 发明人 ブライアン・アイ・トロイ;ミカエル・ルノー;トーマス・エル・マグワイア;ジョセフ・ダミアン・ゴードン・レイシー;ジェイムズ・エフ・ボビー
分类号 B81C1/00;B81B7/02;H01H49/00;H01H59/00 主分类号 B81C1/00
代理机构 代理人
主权项
地址