| 摘要 |
PROBLEM TO BE SOLVED: To suppress an instantaneous voltage drop in a scan test.SOLUTION: A method of designing a semiconductor includes the steps of: performing arrangement and wiring of a plurality of power supply wirings vss1-vss3, vdd1, and vdd2 and a plurality of scan flip-flops 1-9; detecting the number of scan flip-flops that are connected to a first power supply wiring which is included in the plurality of power supply wirings vss1-vss3, vdd1, and vdd2, on the basis of arrangement information obtained by the arrangement and wiring; generating a plurality of clock signals having different phases on the basis of the detected number of scan flip-flops; and assigning the plurality of clock signals having different phases to the plurality of scan flip-flops 1-9. |
