发明名称 X線光学装置及びその調整方法
摘要 The present invention provides a method of adjusting an X-ray optical apparatus which includes: an X-ray source; and a reflective structure where at least three reflective substrate arranged with an interval and X-rays which are incident into a plurality of passages whose both sides are put between the reflective substrates are reflected and parallelized by the reflective substrate at both sides of each passage to be emitted from the passage. When one edge of the reflective structure is an inlet of the X-ray and the other edge is an outlet of the X-ray, a pitch of the reflective substrates at the outlet side is larger than a pitch at the inlet side. The method comprises adjusting the relative positions of the X-ray source and the reflective structure so as to reduce a penumbra amount formed by the X-ray emitted from each of the passages.
申请公布号 JP6016391(B2) 申请公布日期 2016.10.26
申请号 JP20120056843 申请日期 2012.03.14
申请人 キヤノン株式会社 发明人 飯塚 直哉;雨宮 光陽;三宅 明
分类号 G21K1/06;A61B6/03;A61B6/06;G21K1/00 主分类号 G21K1/06
代理机构 代理人
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