发明名称 処理装置、処理方法及び記憶媒体
摘要 PROBLEM TO BE SOLVED: To suppress deterioration of a seal member provided between a lid airtightly closing a carry-in/out port of a processing container and the processing container, and contamination of a processed substrate via the seal member when performing processing to the processed substrate using a high-pressure fluid in the processing container.SOLUTION: A first seal member 11 and a second seal member 12 are arranged in this order from a carry-in/out port 2 side to the outside of a processing container 1 between the processing container 1 and a lid 3 so as to surround the carry-in/out port 2 which carries in/out a wafer W in the processing container 1 and the first seal member 11 is made of a material having corrosion resistivity for a high-pressure fluid. Then, a nitrogen gas is supplied to a differential pressure mitigating region 13 in order to mitigate differential pressure applied to the first seal member 11, pressure in the differential pressure mitigating region 13 is set to be lower than pressure in the processing container 1 and higher than the outside of the processing container 1, and outflow of the nitrogen gas to the outside is prevented by the second seal member 12.
申请公布号 JP6015738(B2) 申请公布日期 2016.10.26
申请号 JP20140238132 申请日期 2014.11.25
申请人 東京エレクトロン株式会社 发明人 五師 源太郎
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
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