| 摘要 |
A method and system (2) for performing automated defect detection is disclosed. The system may include at least one database (20), an image capture device (10) and a processor (14). The method may comprise providing at least one database (20) for storing information used in processing data to detect a defect in at least one member of a plurality of members in a device. The information may include a plurality of different modes of data. The method may further comprise providing a processing unit (14) for processing the information; receiving (102), by the database, updates to the information; identifying a potential defect in a first mode of data; applying (105), by the processing unit, analysis of a second mode of data, the analysis of the second mode of data triggered by the identifying, the second mode of data different than the first mode of data; and reporting defects based on the results of the applying. |
