发明名称 Method and device for impedance analyzer with binary excitation
摘要 Method and device for impedance analyzer with binary excitation with improved accuracy, where the non-idealities of the sampling and preprocessing of the response signal (including aliasing effects) are taken into account by using of the overall system model with equivalent circuit diagrams of the analyzed object and the model of the preliminary analysis of the response signal. The analysis result is the equivalent circuit diagram with component values with the best match of the overall model analysis and of the preliminary analyze of the response signal. Further, the analysis result can be the impedance frequency characteristic or the classifier of the analyzed object. It could be reasonable to use the pre-calculated function (e.g. in the form of the look-up-table) for matching the results of the over-all model against the preliminary analyzed results of the response signal.
申请公布号 US2016305996(A1) 申请公布日期 2016.10.20
申请号 US201615132381 申请日期 2016.04.19
申请人 Tallinn University of Technology ;ELIKO Tehnoloogia Arenduskeskus OÜ 发明人 Märtens Olev;Land Raul;Min Mart;Annus Paul;Reidla Marko
分类号 G01R27/02;G01R23/00 主分类号 G01R27/02
代理机构 代理人
主权项 1. A method for analyzing impedance with binary excitation said method comprising the steps of: a) generating a binary excitation signal and applying the signal to an object under test; b) receiving a response signal and initially analyzing the response signal; c) obtaining estimation parameters of the object by the initial analysis of the response signal in step b) and using the estimation parameters as input values for frequency characteristic estimation; d) generating parameters of a model, wherein the parameters are controlled by output results of the estimation of the parameters of the object under test; e) using waveform of excitation signal as an input and generating a model of initial analysis of the response signal, the model having parameters which are determined by the output result of the generation of the parameter of the model of step d), and f) estimating the parameters of the object under test, controlled by the output results of the model of the initial analysis of the response signal of step e); wherein in the analysis of the parameters of the object under test, the parameters are determined for the model, in which the results of the initial analysis of the response signal are maximally similar to the results of the model of the initial analysis of the response signal.
地址 Tallinn EE