Probe Card

摘要

A probe card for transmitting power signals from a tester to two devices under test (DUTs) is provided, which includes two signal pins, two power conducting circuits, and at least a matching part. The signal pins are made of conductive materials, wherein one end of the signal pin contacts one of the DUTs. The two power conducting circuits are electrically connected to the two signal pins respectively to transmit the power signals to the DUTs. One of two ends of the power conducting circuits is connected to the signal pins; the other end of the power conducting circuits is electrically connected to the tester. The matching part is electrically connected to the power conducting circuit in parallel to lower a resistance of the power conducting circuit below a predetermined value, or to lower a percentage error of resistance of the power conducting circuit below a predetermined percentage error.

主权项

1. A probe card for transmitting power signals from a tester to two devices under test (DUTs), wherein the tester provides power to the DUTs via the power signals, and the DUTs are tested with the power; the probe card comprising:
two signal pins made of conductive materials, wherein each of the two signal pins has two ends, and one of the two ends thereof contacts one of the DUTs; two power conducting circuits electrically connected to the two signal pins respectively to transmit the power signals to the DUTs, wherein each of the two power conducting circuits has two ends, and one of the two ends thereof is connected to the other end of the signal pins; the other end of each of the power conducting circuits is electrically connected to the tester; and at least a matching part electrically connected to at least one of the power conducting circuits in parallel to lower a resistance of the at least one of the power conducting circuits below a predetermined value.