发明名称 CHARGED PARTICLE BEAM DRAWING DEVICE AND DRAWING DATE CREATION METHOD
摘要 PROBLEM TO BE SOLVED: To enhance the data processing efficiency of correction data for suppressing variation of pattern dimension caused by a phenomenon having a small influence radius.SOLUTION: Drawing data has dose information for correcting a proximity effect to be input into a charged particle beam drawing device. A method for creating the drawing data comprises a step of inputting drawing data with a correction map which has a correction map containing dose information corresponding to a drawing area, a step of dividing the drawing area into plural sub-frames, dividing the sub-frame into plural blocks, and allocating, to each block, the divided map which is obtained by dividing the correction map, a step of filing the mesh size of the divided map contained in each block, the number of meshes and the dose information in each mesh on a sub-frame basis, and a step of outputting drawing data with a hierarchical correction map which has a hierarchical correction map having plural files corresponding to plural sub-frames.SELECTED DRAWING: Figure 9
申请公布号 JP2016184605(A) 申请公布日期 2016.10.20
申请号 JP20150062960 申请日期 2015.03.25
申请人 NUFLARE TECHNOLOGY INC 发明人 HARA SHIGEHIRO;YASUI KENICHI;YAMASHITA HIROSHI;KATO YASUO;GOMI SAORI;SAKAMOTO SHINJI;TAMURA TAKAHISA;TSUCHIYA HIDEO;NAKAYAMADA NORIAKI;MATSUMOTO HIRONOBU
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址