发明名称 METHOD OF MANIPULATING A SAMPLE IN AN EVACUATED CHAMBER OF A CHARGED PARTICLE APPARATUS
摘要 The invention relates to a method of manipulating a sample (100) in an evacuated chamber of a charged particle apparatus, the method performed in said evacuated chamber, the method comprising: €¢ A step of providing a sample (100) on a first substrate (300), €¢ A step of bringing an extremal end of a manipulator (304) in contact with the sample, €¢ A step of attaching the sample to said extremal end, the attaching being a removable attaching, €¢ A step of lifting the sample attached to the extremal end of the manipulator from the first substrate and transport the sample to a second substrate (308), €¢ A step of attaching the sample to the second substrate, €¢ A step of detaching the sample from the extremal end of the manipulator, Characterized in that €¢ At least one of the steps of attaching the sample comprises attaching the sample to a bundle of carbon nanotubes (306), said step a step of detachably attaching the sample to said carbon nanotubes. The use of a carbon nanotubes (CNT) function area results in a quick method for attaching/detaching a sample avoiding the risks of losing a sample when electrostatically gripped or the risks of mechanical deformation when using a mechanical gripper.
申请公布号 EP3082148(A1) 申请公布日期 2016.10.19
申请号 EP20150163671 申请日期 2015.04.15
申请人 FEI COMPANY 发明人 VYSTAVEL, TOMÁS;BAKEN, ELLEN;VESSEUR, ERNST JAN;POLOUCEK, PAVEL
分类号 H01J37/20 主分类号 H01J37/20
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