发明名称 共焦点顕微鏡システム、画像処理方法および画像処理プログラム
摘要 PROBLEM TO BE SOLVED: To provide a confocal microscope system configured to detect a profile curve of a surface of an object accurately at a high speed, an image processing method, and an image processing program.SOLUTION: In a unit area on a surface of an object S, one-dimensional scanning is performed with a laser beam on measurement lines parallel to a first direction, and the one-dimensional scanning is repeated with displacement in a second direction orthogonal to the first direction. The laser beam reflected by the object S is received by a light-receiving element 30, and multiple pieces of pixel data on the measurement lines are sequentially acquired. In a profile-curve data acquisition range which is larger in the first direction and smaller in the second direction than the unit area, first and second two-dimensional data are generated which indicate peak intensity and peak position of a receiving light intensity distribution in an optical axis direction of an objective lens, respectively, for each pixel. A profile curve corresponding to a position of the measurement line designated on an image based on the fist two-dimensional data, is displayed on the basis of the second two-dimensional data.
申请公布号 JP6009005(B2) 申请公布日期 2016.10.19
申请号 JP20150008888 申请日期 2015.01.20
申请人 株式会社キーエンス 发明人 岡本 陽一;田淵 潤
分类号 G02B21/00;G01B11/24;G01B11/30 主分类号 G02B21/00
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