发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide an art capable of achieving low channel resistance in a semiconductor device having hetero junction which achieves normally-off by using an insulation gate part.SOLUTION: HFET 1 comprises: an electron transit layer 14; an electron supply layer 15; a drain electrode 22, a source electrode 28; and an insulation gate part 25 provided in a trench which pierces the electron supply layer 15 to reach a predetermined depth of the electron transit layer 14. The insulation gate part 25 includes a main part 25Am extending in a gate width direction and projected parts 25Bd, 25Bs which project from the main part 25Am along a gate length direction.
申请公布号 JP6011414(B2) 申请公布日期 2016.10.19
申请号 JP20130063253 申请日期 2013.03.26
申请人 トヨタ自動車株式会社 发明人 桑原 誠;青木 宏文;富田 英幹
分类号 H01L21/338;H01L21/28;H01L21/336;H01L29/41;H01L29/423;H01L29/49;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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