| 摘要 |
An X-ray fluorescence analyzer device comprises a closed radiation chamber (102) containing a gaseous substance. An X-ray source (104) emits incident X-rays towards a sample (100) and an X-ray detector (105) receives fluorescent X-rays from the sample (100) through the radiation chamber (102). A pressure indicator system (106) indicates, whether the pressure inside the radiation chamber (102) is higher than a surrounding pressure by a predetermined threshold. X-ray fluorescence measurements are allowed when the pressure inside the radiation chamber (102) is higher than said surrounding pressure by said predetermined threshold. |
