发明名称 蛍光X線分析装置を用いた定量分析方法
摘要 PROBLEM TO BE SOLVED: To provide a method for highly accurately and correctly measuring the content of a desired component contained in a solution to be measured with reduced variations at low costs.SOLUTION: A quantitative analysis method using an X-ray fluorescence analyzer, which quantitatively analyzes the concentration of a predetermined component contained in a solution to be measured using the X-ray fluorescence analyzer, comprises the steps of: measuring the density of the solution to be measured; weighing the solution to be measured; adding a component not contained in the solution to be measured as an internal reference component to the weighed solution to be measured to prepare a mixed solution, and weighing the added amount of the internal reference component; using the mixed solution as it is or diluting it at a desired rate and then loading it to the X-ray fluorescence analyzer; using the X-ray fluorescence analyzer to obtain a ratio of intensity between the predetermined component and the internal reference component and to obtain a ratio of concentration between the predetermined component and the internal reference component using a previously-prepared calibration curve of the ratio of intensity between the predetermined component and the internal reference component and a ratio of concentration between the predetermined component and the internal reference component; and obtaining the concentration (volume fraction) of the predetermined component contained in the solution to be measured from the ratio of concentration between the predetermined component and the internal reference component and the density of the solution to be measured.
申请公布号 JP6007866(B2) 申请公布日期 2016.10.12
申请号 JP20130127020 申请日期 2013.06.17
申请人 住友金属鉱山株式会社 发明人 加岳井 敦
分类号 G01N23/223 主分类号 G01N23/223
代理机构 代理人
主权项
地址