发明名称 Positive resist composition for immersion exposure and pattern-forming method using the same
摘要 A positive resist composition for immersion exposure comprises: (A) a resin containing at least one repeating unit having a fluorine atom and increasing a solubility of the resin in an alkali developer by an action of an acid; and (B) a compound capable of generating an acid upon irradiation with one of an actinic ray and radiation.
申请公布号 EP1580598(B1) 申请公布日期 2016.10.12
申请号 EP20050005530 申请日期 2005.03.14
申请人 FUJIFILM CORPORATION 发明人 INABE, HARUKI;KANNA, SHINICHI;KANDA, HIROMI
分类号 G03F7/004;G03F7/039;G03F7/20 主分类号 G03F7/004
代理机构 代理人
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