发明名称 MONOS DEVICE HAVING BURIED METAL SILICIDE BIT LINE AND MANUFACTURING METHOD THEREOF
摘要 A MONOS device and method for making the device has a charge trapping dielectric layer, such as an oxide-nitride-oxide (ONO) layer, formed on a substrate. A recess is created through the ONO layer and in the substrate. A metal silicide bit line is formed in the recess and bit line oxide is formed on top of the metal silicide. A word line is formed over the ONO layer and the bit line oxide, and a low resistance silicide is provided on top of the word line. The silicide is formed by laser thermal annealing, for example.
申请公布号 EP1456885(B1) 申请公布日期 2016.10.12
申请号 EP20020792367 申请日期 2002.12.11
申请人 CYPRESS SEMICONDUCTOR CORPORATION 发明人 OGURA, JUSUKE;RAMSBEY, MARK, T.;HALLIYAL, ARVIND;KRIVOKAPIC, ZORAN;NGO, MINH, VAN;TRIPSAS, NICHOLAS, H.
分类号 H01L21/8247;H01L27/115;H01L21/336;H01L21/74;H01L21/8246;H01L29/66;H01L29/788;H01L29/792 主分类号 H01L21/8247
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