ACTIVE DEVICE ARRAY SUBSTRATE

摘要

An active device array substrate includes a substrate, an inspection circuit, pixel structures, a passivation layer, and conductive pads. The substrate has a display area and a peripheral area outside the display area. The inspection circuit is located on the substrate and includes inspection switches, inspection control lines, and inspection traces. Each of the inspection switches is located in the peripheral area and controlled by one of the inspection control lines. Each of the inspection traces is connected to one of the inspection switches and includes a first conductive wire segment and a second conductive wire segment. The second conductive wire segment is connected between the first conductive wire segment and one corresponding inspection switch. An electric conductivity of the second conductive wire segment is lower than an electric conductivity of the first conductive wire segment.

主权项

1. An active device array substrate comprising:
a substrate having a display area and a peripheral area outside the display area; an inspection circuit arranged on the substrate, the inspection circuit comprising a plurality of inspection switches, a plurality of inspection control lines, and a plurality of inspection traces, each of the inspection switches being located in the peripheral area and controlled by one of the inspection control lines to be switched on or off, each of the inspection traces being connected to one of the inspection switches and comprising a first conductive wire segment and a second conductive wire segment, wherein the second conductive wire segment is connected between the first conductive wire segment and a corresponding inspection switch of the inspection switches, and an electric conductivity of the second conductive wire segment is lower than an electric conductivity of the first conductive wire segment; a plurality of pixel structures arranged on the substrate and located in the display area, each of the pixel structures being connected to the first conductive wire segment of one of the inspection traces; a passivation layer covering the inspection switches of the inspection circuit and having a plurality of pad openings, wherein each of the pad openings corresponds to one of the first conductive wire segments; and a plurality of conductive pads arranged on the passivation layer, each of the conductive pads being located in one of the pad openings to electrically connect one of the inspection traces.