| 摘要 |
The present invention provides a semiconductor inspection device that, even when used for a vertical handler, allows a contact pin of an inspection socket and an external contact terminal of an inspected IC to reliably come into contact with each other. A semiconductor inspection device 1 has an inspection socket 3 having a socket surface 31 formed thereon, the socket surface 31 having contact pins 32 protruding therefrom, and a semiconductor transportation jig 2 having a recess 22 into which an inspected IC 4 is inserted. The semiconductor inspection device 1 is characterized in that: a position adjustment guide 33 is provided in the inspection socket 3; a guide through-hole 27 through which the position adjustment guide 33 passes when the inspected IC 4 is inspected is provided in the semiconductor transportation jig 2; and one of the position adjustment guide 33 and the guide through-hole 27 is tapered. |
