发明名称 MAGNETO-RESISTIVE EFFECT ELEMENT WITH RECESSED ANTIFERROMAGNETIC LAYER
摘要 A magneto-resistive effect element (MR element) has a first shield layer; a second shield layer; an inner shield layer that is positioned between the first shield layer and the second shield layer, and that makes contact with the first shield layer and faces the air bearing surface (ABS); and a multilayer film that is positioned between the first shield layer and the second shield layer. The multilayer film has a free layer; a first pinned layer; a nonmagnetic spacer layer; a second pinned layer that fixes the magnetization direction of the first pinned layer; and an antiferromagnetic layer that is exchange-coupled with the second pinned layer. The antiferromagnetic layer faces the back surface of the inner shield layer viewed from the ABS. The MR element has an insulating layer positioned between the antiferromagnetic layer and the inner shield layer.
申请公布号 US2016293188(A1) 申请公布日期 2016.10.06
申请号 US201514753301 申请日期 2015.06.29
申请人 TDK Corporation 发明人 DEGAWA Naomichi;MAKINO Kenzo;MIURA Satoshi;KANAYA Takayasu
分类号 G11B5/39;G11B5/60 主分类号 G11B5/39
代理机构 代理人
主权项 1. A magneto-resistive effect element (MR element), comprising: a first shield layer, a second shield layer, an inner shield layer that is positioned between the first shield layer and the second shield layer, that faces the first shield layer, and that faces an air bearing surface (ABS), and a multilayer film that is positioned between the first shield layer and the second shield layer, wherein the multilayer film comprises a free layer having a magnetization direction that fluctuates relative to an external magnetic field,a first pinned layer that is positioned closer to the first shield layer than the free layer, and having a magnetization direction that is fixed relative to the external magnetic field,a nonmagnetic spacer layer that is positioned between the free layer and the first pinned layer,a second pinned layer that is positioned closer to the first shield layer than the first pinned layer, and that fixes the magnetization direction of the first pinned layer, andan antiferromagnetic layer that is positioned closer to the first shield layer than the second pinned layer, and that is exchange-coupled with the second pinned layer; the antiferromagnetic layer faces the back surface of the inner shield layer viewed from the ABS; and the MR element comprises an insulating layer between the antiferromagnetic layer and the inner shield layer, wherein the second pinned layer comprises a first part facing the back surface of the inner shield layer and a second part that makes contact with the first part, and that extends to the ABS between the first part and the first pinned layer and between the inner shield layer and the first pinned layer, and the insulating layer is positioned between the first part and the inner shield layer, and between the antiferromagnetic layer and the inner shield layer.
地址 Tokyo JP
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