MULTI-PORT MEASUREMENT TECHNIQUE

摘要

This invention relates to an apparatus, a method and a computer program for calculating one or more scattering parameters of a linear network, the network including a number of N ports adapted to provide electric connections. The apparatus is configured to calculate, and the method includes calculating, one or more scattering parameters of the linear network, which are related to a reference impedance, on the basis of a measured electrical response at one or more ports of the linear network to an incident wave applied at a port of the linear network, measured under the condition that one or more of other ports of the linear network face a reflection coefficient Γ with an amplitude ρ of 0.5 or larger. The computer program is adapted to perform such a method and runs on a computer.

主权项

1. An apparatus comprising:
a device operable to calculate one or more scattering parameters of a linear network comprising a number of N ports adapted to provide electric connections, wherein the device is configured to calculate the one or more scattering parameters, which are related to a reference impedance R0, on a basis of an electrical response that is measured at one or more ports of the linear network to an incident wave applied at a port of the linear network and that is measured under the condition that one or more of other ports of the linear network face a reflection coefficient Γ with an amplitude ρ of 0.5 or larger.