发明名称 SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND NON TRANSITORY COMPUTER READABLE STORAGE STORING A COMPUTER PROGRAM
摘要 A sample analyzer includes: a preparation unit configured to mix a sample with a reagent to prepare a measurement specimen; a measurement unit configured to irradiate the measurement specimen with light to acquire optical time series data; and a controller configured to divide the time series data acquired by the measurement unit into data segments, determine first regression lines respectively of the data segments, select the first regression line with the highest matching degree with the time series data, set as an analysis target region a region of the time series data matching with the selected first regression line among the time series data acquired by the measurement unit, determine a second regression line using the time series data included in the set analysis target region, and perform an analysis using the second regression line.
申请公布号 US2016291040(A1) 申请公布日期 2016.10.06
申请号 US201615080129 申请日期 2016.03.24
申请人 SYSMEX CORPORATION 发明人 KOSHIMURA Naoto
分类号 G01N33/86;G01N21/3577;G01N21/27 主分类号 G01N33/86
代理机构 代理人
主权项 1. A sample analyzer comprising: a preparation unit that mixes a sample with a reagent to prepare a measurement specimen; a measurement unit that irradiates the measurement specimen with light to acquire optical time series data; a controller that divides the time series data acquired by the measurement unit into data segments, determines first regression lines respectively of the data segments, select the first regression line with the highest matching degree with the time series data, sets as an analysis target region a region of the time series data matching with the selected first regression line among the time series data acquired by the measurement unit, determines a second regression line using the time series data included in the set analysis target region, and analyzes using the second regression line.
地址 Kobe-shi JP