发明名称 Optical Inspection System
摘要 Provided is an optical inspection system including a supporting unit, allowing a target object to be loaded thereon, a light source unit configured to emit a laser beam toward the target object, a light condensing unit collecting scattered light that is scattered at the target object when the laser beam is irradiated onto the target object, and a control unit controlling the light source unit and the light condensing unit and analyzing the scattered light to examine whether there are pollutants on the target object. The supporting unit may include a first supporting unit, on which the target object is disposed, and which is formed of a first material, and a second supporting unit, which is disposed under the first supporting unit and is formed of a second material different from the first material.
申请公布号 US2016290933(A1) 申请公布日期 2016.10.06
申请号 US201514955331 申请日期 2015.12.01
申请人 Samsung Electronics Co., Ltd. ;Samsung Display Co., Ltd. 发明人 Seo Wonguk;KIM Kyoungchon;YOON Kuihyun;KIM Kyunlae;PARK Jaeyoung;YANG Kyoungho;HEO Young
分类号 G01N21/94;G01N21/958;G01N21/88 主分类号 G01N21/94
代理机构 代理人
主权项 1. An optical inspection system, comprising: a supporting unit; a light source unit configured to emit a laser beam toward a target object on the supporting unit; a light condensing unit configured to collect scattered light when the target object is irradiated with the laser beam; and a control unit configured to control the light source unit and the light condensing unit and to analyze the scattered light to determine if pollutants are on the target object, wherein the supporting unit comprises: a first supporting member, on which the target object is disposed, and which comprises a first material; anda second supporting member under the first supporting member, wherein the second supporting member comprises a second material different from the first material.
地址 Suwon-si KR