发明名称 |
RADIATION-SENSITIVE COMPOSITION AND RESIST PATTERN FORMATION METHOD |
摘要 |
A radiation-sensitive composition containing a resist base material (A), a diazonaphthoquinone optically-active compound (B), and a solvent (C). The solid component content in the radiation-sensitive composition is 1%-80% by mass, the solvent content is 20%-99% by mass, and the resist base material (A) is a compound indicated by formula (1). |
申请公布号 |
WO2016158881(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
WO2016JP59980 |
申请日期 |
2016.03.28 |
申请人 |
MITSUBISHI GAS CHEMICAL COMPANY, INC. |
发明人 |
ECHIGO, Masatoshi;TOIDA, Takumi;SATO, Takashi |
分类号 |
G03F7/022 |
主分类号 |
G03F7/022 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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