发明名称 |
ULTRASONIC THICKNESS MEASUREMENT METHOD AND APPARATUS, AND DEFECT POSITION DETECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To easily and accurately measure the thickness of a subject in which crystal grains constituting a metal crystal structure have a statistical variation and the crystal orientation is unclear.SOLUTION: A method for detecting the thickness and defect position of a subject using an ultrasonic wave comprises: a step (S107) of setting the root-mean-square sound velocity; a step (S104) of propagating a vertically polarized transverse wave and a horizontally polarized transverse wave in a subject, and measuring the propagation time of the vertically polarized transverse wave and the horizontally polarized transverse wave; a step (S106) of propagating the longitudinal ultrasonic wave in the subject and measuring the longitudinal wave propagation time; a step (S108) of calculating the effective propagation time from the vertically polarized transverse wave propagation time, the horizontally polarized transverse wave propagation time and the longitudinal wave propagation time; and a step (S109) of calculating the thickness and defect position of the subject from the root-mean-square sound velocity and the effective propagation time.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016176884(A) |
申请公布日期 |
2016.10.06 |
申请号 |
JP20150058917 |
申请日期 |
2015.03.23 |
申请人 |
HITACHI LTD |
发明人 |
KITAOKA MASANORI;MIZOTA HIROHISA |
分类号 |
G01B17/02;G01N29/07;G01N29/34 |
主分类号 |
G01B17/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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