发明名称 |
VERTICAL GATE-ALL-AROUND TFET |
摘要 |
A vertical tunneling FET (TFET) provides low-power, high-speed switching performance for transistors having critical dimensions below 7 nm. The vertical TFET uses a gate-all-around (GAA) device architecture having a cylindrical structure that extends above the surface of a doped well formed in a silicon substrate. The cylindrical structure includes a lower drain region, a channel, and an upper source region, which are grown epitaxially from the doped well. The channel is made of intrinsic silicon, while the source and drain regions are doped in-situ. An annular gate surrounds the channel, capacitively controlling current flow through the channel from all sides. The source is electrically accessible via a front side contact, while the drain is accessed via a backside contact that provides low contact resistance and also serves as a heat sink. Reliability of vertical TFET integrated circuits is enhanced by coupling the vertical TFETs to electrostatic discharge (ESD) diodes. |
申请公布号 |
US2016293739(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
US201615177231 |
申请日期 |
2016.06.08 |
申请人 |
STMICROELECTRONICS, INC. |
发明人 |
ZHANG John H. |
分类号 |
H01L29/66;H01L27/092;H01L29/786;H01L21/8238;H01L29/06;H01L29/423 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A device, comprising:
a silicon substrate; a diode on the substrate, the diode including:
a doped well in the silicon substrate;a nanowire on the substrate extending from the doped well;a first contact is formed on a first end of the nanowire; anda second contact is formed adjacent to a second end of the nanowire, where the second end of the nanowire is adjacent to the doped well. |
地址 |
Coppell TX US |