发明名称 VERTICAL GATE-ALL-AROUND TFET
摘要 A vertical tunneling FET (TFET) provides low-power, high-speed switching performance for transistors having critical dimensions below 7 nm. The vertical TFET uses a gate-all-around (GAA) device architecture having a cylindrical structure that extends above the surface of a doped well formed in a silicon substrate. The cylindrical structure includes a lower drain region, a channel, and an upper source region, which are grown epitaxially from the doped well. The channel is made of intrinsic silicon, while the source and drain regions are doped in-situ. An annular gate surrounds the channel, capacitively controlling current flow through the channel from all sides. The source is electrically accessible via a front side contact, while the drain is accessed via a backside contact that provides low contact resistance and also serves as a heat sink. Reliability of vertical TFET integrated circuits is enhanced by coupling the vertical TFETs to electrostatic discharge (ESD) diodes.
申请公布号 US2016293739(A1) 申请公布日期 2016.10.06
申请号 US201615177231 申请日期 2016.06.08
申请人 STMICROELECTRONICS, INC. 发明人 ZHANG John H.
分类号 H01L29/66;H01L27/092;H01L29/786;H01L21/8238;H01L29/06;H01L29/423 主分类号 H01L29/66
代理机构 代理人
主权项 1. A device, comprising: a silicon substrate; a diode on the substrate, the diode including: a doped well in the silicon substrate;a nanowire on the substrate extending from the doped well;a first contact is formed on a first end of the nanowire; anda second contact is formed adjacent to a second end of the nanowire, where the second end of the nanowire is adjacent to the doped well.
地址 Coppell TX US