发明名称 |
INTEGRATED CIRCUIT TEST TEMPERATURE CONTROL MECHANISM |
摘要 |
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data and a dynamic thermal controller to receive the target setpoint temperature from the thermal control interface and control a thermal actuator based on the target setpoint temperature. |
申请公布号 |
US2016291083(A1) |
申请公布日期 |
2016.10.06 |
申请号 |
US201615185468 |
申请日期 |
2016.06.17 |
申请人 |
INTEL CORPORATION |
发明人 |
Johnson John C.;MAVEETY James G.;Detofsky Abram M.;Neeb James E. |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
SANTA CLARA CA US |