发明名称 INTEGRATED CIRCUIT TEST TEMPERATURE CONTROL MECHANISM
摘要 A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data and a dynamic thermal controller to receive the target setpoint temperature from the thermal control interface and control a thermal actuator based on the target setpoint temperature.
申请公布号 US2016291083(A1) 申请公布日期 2016.10.06
申请号 US201615185468 申请日期 2016.06.17
申请人 INTEL CORPORATION 发明人 Johnson John C.;MAVEETY James G.;Detofsky Abram M.;Neeb James E.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址 SANTA CLARA CA US