发明名称 |
SUBSTRATE FOR MASK BLANK, MASK BLANK, REFLECTION TYPE MASK BLANK, TRANSFER MASK, REFLECTION TYPE MASK AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate for mask blank capable of eliminating adverse effects of a substrate mark consisting of slope cross section on flatness and enhancing flatness during abrasive processing, a mask blank and a transfer mask and a manufacturing method therefor.SOLUTION: A substrate for mask blank 1 has a substrate mark 4 consisting a slope cross section formed, an angle of inclination of the substrate mark 4 to a main surface 112 is more than 45° and less than 90° and a distance from a boundary between the main surface 112 and the substrate mark 4 to a circumference of the substrate for mask blank is 1 Wof less than 1.5 mm.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016177317(A) |
申请公布日期 |
2016.10.06 |
申请号 |
JP20160113463 |
申请日期 |
2016.06.07 |
申请人 |
HOYA CORP |
发明人 |
SASAKI TATSUYA;NISHIMURA TAKAHITO |
分类号 |
G03F1/38;G03F1/24;G03F1/26;G03F1/50;G03F1/60 |
主分类号 |
G03F1/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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