DEVICES AND METHODS FOR ASSESSMENT OF SURFACES

摘要

Devices and methods for assessing topography of a reflective surface are provided. The methods comprise directing an arrayed light source onto the reflective surface to produce a reflected light pattern; and observing the reflected light pattern without the use of a computer to detect the presence of one or more topographical features of the reflective surface. The devices comprise an arrayed light source and a portable support operatively connected to the arrayed light source by an adjusting element. The presence of one or more topographical features of the reflective surface to are noted by an observer without the use of a computer. Defects may be discerned by the presence of a swirl in a reflected light pattern.