发明名称 MEMORY UNIT WITH VOLTAGE PASSING DEVICE
摘要 A memory cell (10) includes a floating gate transistor (FGT1), a word line transistor (WLT1) , a first capacitance element (110), a second capacitance element (120), and a first voltage passing device (130). The floating gate transistor (FGT1) has a first terminal for receiving a bit line signal (BL), a second terminal, and a floating gate. The word line transistor (WLT1) is coupled to the floating gate transistor (FGT1), receives a third voltage (GND), and is controlled by a word line signal (WL). The first capacitance element (110) is coupled to the first voltage passing device (130) and the floating gate, and receives a first control signal (CS1). The voltage passing device (130) outputs a second voltage (VZ) during an inhibit operation and a first voltage (VPP) during a program operation or an erase operation. With the voltage passing device, the reading time and the power consumption can both be reduced.
申请公布号 EP3076394(A1) 申请公布日期 2016.10.05
申请号 EP20160161368 申请日期 2016.03.21
申请人 EMEMORY TECHNOLOGY INC. 发明人 CHEN, CHIH-HSIN;WANG, SHIH-CHEN;LAI, TSUNG-MU
分类号 G11C16/04 主分类号 G11C16/04
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