发明名称 |
DEFECT INSPECTION DEVICE, MANAGEMENT METHOD OF DEFECT INSPECTION DEVICE AND MANAGEMENT UNIT |
摘要 |
PROBLEM TO BE SOLVED: To provide a management method of a defect inspection device capable of reliably discriminating signals which are obtained from a defect to be detected from noise components.SOLUTION: The management method of the defect inspection device includes the steps of: with respect to plural measurement points on a measuring object, generating a differential value between a signal acquired from an image of the measuring object and a signal acquired from a reference image (S14); generating a frequency distribution of the differential value (S15); and determining whether the frequency distribution satisfies a predetermined condition (S16).SELECTED DRAWING: Figure 4 |
申请公布号 |
JP2016173252(A) |
申请公布日期 |
2016.09.29 |
申请号 |
JP20150052346 |
申请日期 |
2015.03.16 |
申请人 |
TOSHIBA CORP |
发明人 |
HIRANO RYOICHI;IIDA SUSUMU |
分类号 |
G01N21/88;G01B11/24;G01N21/956;G03F1/84;G03F7/20;H01L21/66 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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