发明名称 DEFECT INSPECTION DEVICE, MANAGEMENT METHOD OF DEFECT INSPECTION DEVICE AND MANAGEMENT UNIT
摘要 PROBLEM TO BE SOLVED: To provide a management method of a defect inspection device capable of reliably discriminating signals which are obtained from a defect to be detected from noise components.SOLUTION: The management method of the defect inspection device includes the steps of: with respect to plural measurement points on a measuring object, generating a differential value between a signal acquired from an image of the measuring object and a signal acquired from a reference image (S14); generating a frequency distribution of the differential value (S15); and determining whether the frequency distribution satisfies a predetermined condition (S16).SELECTED DRAWING: Figure 4
申请公布号 JP2016173252(A) 申请公布日期 2016.09.29
申请号 JP20150052346 申请日期 2015.03.16
申请人 TOSHIBA CORP 发明人 HIRANO RYOICHI;IIDA SUSUMU
分类号 G01N21/88;G01B11/24;G01N21/956;G03F1/84;G03F7/20;H01L21/66 主分类号 G01N21/88
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