发明名称 抵抗変化型ランダムアクセスメモリおよびその製造方法
摘要 Provided is a resistive random access memory including a first electrode layer (102), a second electrode layer (106), and a variable resistance layer (104) disposed between the first electrode layer and the second electrode layer, wherein the second electrode layer includes a first sublayer (108), a second sublayer (112), and a conductive metal oxynitride layer (110) disposed between the first sublayer and the second sublayer.
申请公布号 JP6000328(B2) 申请公布日期 2016.09.28
申请号 JP20140265764 申请日期 2014.12.26
申请人 華邦電子股▲ふん▼有限公司Winbond Electronics Corp. 发明人 何家▲か▼;張碩哲;廖修漢;許博硯;林孟弘;▲呉▼伯倫;沈鼎瀛
分类号 H01L27/105;H01L45/00;H01L49/00 主分类号 H01L27/105
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