| 摘要 |
PROBLEM TO BE SOLVED: To reliably cause a pair of probes to come into contact with a probing object.SOLUTION: A probe unit is configured such that base end parts 31 of a pair of parallely arranged probes 12 are connected in an insulation state and a tip end part 32 of each probe 12 can simultaneously come into contact with one probing object, and the probe 12 has a thin thickness part 33, which is thinner than other parts in the probe 12, formed between the base end part 31 and the tip end part 32, and is configured to be deformable with the thin thickness part 33 as a supporting point such that the tip end part 32 secedes from the tip end part 32 of the other probe 12. |
