发明名称 光フィルター、光フィルターモジュール、分光測定器および光機器
摘要 PROBLEM TO BE SOLVED: To facilitate design of characteristics of an optical filter.SOLUTION: An etalon filter 300 includes a first substrate 20, a second substrate 30 facing the first substrate, a first optical film 40 provided to the first substrate, and a second optical film 50 provided to the second substrate to face the first optical film. A reflection characteristic L1 determined by the reflectivity of light of each wavelength in a reflection band in the first optical film 40 is different from a reflection characteristic L2 determined by the reflectivity of light of each wavelength in a reflection band in the second optical film 50. The optical film 40 can have a reflection characteristic where a first wavelength &lambda;1 is a center wavelength, and the second optical film 50 can have a reflection characteristic where a second wavelength &lambda;2 different from the first wavelength is a center wavelength. The optical films 40 and 50 are so designed that the relation of &lambda;1<&lambda;3<&lambda;2 is established, where a center wavelength in a spectral band of the etalon filter 300 is &lambda;3.
申请公布号 JP5999159(B2) 申请公布日期 2016.09.28
申请号 JP20140203166 申请日期 2014.10.01
申请人 セイコーエプソン株式会社 发明人 松下 友紀;漆谷 多二男
分类号 G02B5/28;B81B3/00 主分类号 G02B5/28
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