发明名称 SILICON GERMANIUM FINFET FORMATION
摘要 Methods for fabricating a fin in a fin field effect transistor (FinFET), include exposing a single crystal fin structure coupled to a substrate of the FinFET. The single crystal fin structure is of a first material. The method further includes implanting a second material into the exposed single crystal fin structure at a first temperature. The first temperature reduces amorphization of the single crystal fin structure. The implanted single crystal fin structure comprises at least 20% of the first material. The method also includes annealing the implanted fin structure at a second temperature. The second temperature reduces crystal defects in the implanted fin structure to form the fin.
申请公布号 EP3072157(A1) 申请公布日期 2016.09.28
申请号 EP20140789964 申请日期 2014.10.17
申请人 QUALCOMM INCORPORATED 发明人 XU, JEFFREY JUNHAO;YEAP, CHOH FEI
分类号 H01L29/66;H01L29/10;H01L29/78 主分类号 H01L29/66
代理机构 代理人
主权项
地址