发明名称 |
SILICON GERMANIUM FINFET FORMATION |
摘要 |
Methods for fabricating a fin in a fin field effect transistor (FinFET), include exposing a single crystal fin structure coupled to a substrate of the FinFET. The single crystal fin structure is of a first material. The method further includes implanting a second material into the exposed single crystal fin structure at a first temperature. The first temperature reduces amorphization of the single crystal fin structure. The implanted single crystal fin structure comprises at least 20% of the first material. The method also includes annealing the implanted fin structure at a second temperature. The second temperature reduces crystal defects in the implanted fin structure to form the fin. |
申请公布号 |
EP3072157(A1) |
申请公布日期 |
2016.09.28 |
申请号 |
EP20140789964 |
申请日期 |
2014.10.17 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
XU, JEFFREY JUNHAO;YEAP, CHOH FEI |
分类号 |
H01L29/66;H01L29/10;H01L29/78 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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