发明名称 |
GRAIN ANALYZING METHOD AND SYSTEM USING HRTEM IMAGE |
摘要 |
A method and a system for analyzing grains from a high-resolution transmission electron microscopy (HRTEM) image are disclosed. The method for analyzing grains, which analyzes nano-size grains, comprises: a step of receiving an HRTEM image; a step of setting a local window having a certain size with respect to the received image; a step of calculating local conversion data through the Fourier transform of the local pixel data determined by the local window; and a step of analyzing grains using the local conversion data. |
申请公布号 |
KR20160109303(A) |
申请公布日期 |
2016.09.21 |
申请号 |
KR20150033437 |
申请日期 |
2015.03.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, MIN CHUL;KIM, DAE SIN;KIM, SAT BYUL;KIM, SAE JIN;XIAZHILIANG;LEE, JE HYUN |
分类号 |
G01N23/225;G01N23/04;H01J37/26 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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