发明名称 GRAIN ANALYZING METHOD AND SYSTEM USING HRTEM IMAGE
摘要 A method and a system for analyzing grains from a high-resolution transmission electron microscopy (HRTEM) image are disclosed. The method for analyzing grains, which analyzes nano-size grains, comprises: a step of receiving an HRTEM image; a step of setting a local window having a certain size with respect to the received image; a step of calculating local conversion data through the Fourier transform of the local pixel data determined by the local window; and a step of analyzing grains using the local conversion data.
申请公布号 KR20160109303(A) 申请公布日期 2016.09.21
申请号 KR20150033437 申请日期 2015.03.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, MIN CHUL;KIM, DAE SIN;KIM, SAT BYUL;KIM, SAE JIN;XIAZHILIANG;LEE, JE HYUN
分类号 G01N23/225;G01N23/04;H01J37/26 主分类号 G01N23/225
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