| 摘要 |
PROBLEM TO BE SOLVED: To provide a noise detector capable of accurately measuring substrate noises.SOLUTION: A noise detector (1) includes: a semiconductor substrate (8) having an internal region (8a); a rectifier element (2b) provided on the semiconductor substrate; a constant current supply circuit (3) that supplies current to the rectifier element; a low-pass filter circuit (4) that is connected to a common connection point of the rectifier element and constant current supply circuit; and an insulating region that is provided between the internal region and rectifier element. This configuration allows an accurate detection of the level of a noise signal that is transmitted via the internal region 8a of the semiconductor substrate 8, without using an element that is a noise source of an oscillation circuit and such. Thus, feedback can be applied to a design on the basis of a result of the accurate detection of the level of the noise signal. |
